发明名称 PERFORMANCE BOARD AND TEST SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a performance board and a test system which realize a wide-band and high-precision RF test of an SOC device, and improve their maneuverability for users sharply. SOLUTION: This performance board connects a device to be tested and a testing device electrically, and is fitted with a base board on which the device to be tested is put, a first adaptor portion, and a second adaptor portion. The first adaptor portion is provided with two or more coaxial connectors for electrically connecting the testing device and two or more coaxial cables electrically-connected respectively to predetermined two or more pins of the device to be tested. The second adaptor portion is provided with two or more via holes for electrically connecting the testing device and two or more distributing wires electrically-connected respectively to other two or more pins of the device to be tested. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004108898(A) 申请公布日期 2004.04.08
申请号 JP20020270801 申请日期 2002.09.17
申请人 ADVANTEST CORP 发明人 NAKAJIMA TAKAHIRO
分类号 G01R31/28;G01R1/04;G01R1/073;G01R31/02;G01R31/319;(IPC1-7):G01R31/28 主分类号 G01R31/28
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