| 摘要 |
A mass spectrometer is disclosed comprising at least first and second ion traps which are arranged in series. A relatively high AC or RF voltage is applied to the electrodes forming the first ion trap in order to improve the trapping of energetic or high mass to charge ratio ions. The relatively high AC or RF voltage applied to the first ion trap also has the effect of raising the low mass cut-off of the first ion trap. The second ion trap, arranged downstream of the first ion trap, is arranged to have a lower low mass cut-off than the first ion trap, and hence ions which are not trapped in the first ion trap are trapped in the second ion trap.
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