发明名称 MOSFET with low leakage current and fabrication method thereof
摘要 A MOSFET with low leakage current and method. The MOSFET has a substrate, a channel region, a source/drain region, a gate oxide layer and a conductive layer. The channel region in the substrate has a first region and a second region. The first region has a first threshold voltage and the second region has a second threshold voltage, respectively. The second region is located between the first region and the source/drain region. The first threshold voltage is smaller than the second threshold voltage. The leakage current of the MOSFET has an appropriate reduction by increasing the second threshold voltage of the second region. Significantly, by adjusting the size and position of the second region of the channel region, both the leakage current and the drain current of the MOSFET are readily optimized.
申请公布号 US2004051138(A1) 申请公布日期 2004.03.18
申请号 US20020244533 申请日期 2002.09.17
申请人 JANG WEN-YUEH 发明人 JANG WEN-YUEH
分类号 H01L21/265;H01L21/266;H01L21/336;H01L29/10;(IPC1-7):H01L29/76 主分类号 H01L21/265
代理机构 代理人
主权项
地址