METHOD FOR FORMING DAMASCENE INTERCONNECTION USING TWO-STEP PLATING
摘要
PURPOSE: A method for forming a damascene interconnection is provided to be capable of obtaining a metal interconnection with high reliability and low resistivity without forming voids. CONSTITUTION: An interlayer dielectric(105) is formed on a substrate(100). A deep first opening part(150) and a shallow second opening part(160) are formed by selectively etching the interlayer dielectric. A barrier metal film(170) and a seed layer(180) are sequentially formed on the resultant structure. The first plating film(190) is formed in the first opening part and annealed. The second plating film is formed in the second opening part. The resultant structure is then planarized to expose the interlayer dielectric.
申请公布号
KR20040020782(A)
申请公布日期
2004.03.09
申请号
KR20020068152
申请日期
2002.11.05
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
HA, SANG ROK;JUNG, JU HYEOK;PARK, BYEONG RYUL;PARK, CHAN GEUN;SON, HONG SEONG