| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a module testing device for testing an evaluation object module in which the versatility of a system is improved, a testing period of time is shortened and labor and cost are reduced. <P>SOLUTION: Between a module control circuit 20 and the evaluation object module 12, a wiring pattern circuit 24 forming a part of wiring between them is provided. Since the wiring pattern circuit 24 is constituted of a programmable logic device, the wiring is variably set matched with the specifications of the module control circuit 20 and the evaluation object module 12. Thus, the module control circuit 20 is easily and quickly constructed. Also, since the need of respectively separately forming printed wiring for the tests of a plurality of different evaluation object modules 12 is eliminated, the testing period of time is shortened and the time, labor and cost are reduced. <P>COPYRIGHT: (C)2004,JPO |
