发明名称 Resist composition
摘要 A resist composition showing excellent close adherence at the interface of a substrate and a resist, improving problems in wet etching, having excellent sensitivity and resolution, and also showing excellent resist performances, and comprising a compound of the general formula (I):wherein, R<1 >and R<2 >represent each independently a hydrogen atom or an alkyl group, R<3 >represents a hydrogen atom, alkyl group, aryl group, aralkyl group, alkenyl group, alkylcarbonyl group, arylcarbonyl group or aralkylcarbonyl group, n represents an integer of 1 to 40, m represents an integer of 1 to 5, and l represents an integer of 1 to 5, is provided.
申请公布号 US6689531(B2) 申请公布日期 2004.02.10
申请号 US20020228190 申请日期 2002.08.27
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED;DONGWOO FINE-CHEM CO., LTD. 发明人 KIM SANG TAE;KANG SEUNG JIN;SUNG SHI JIN;SUETSUGU MASUMI;YAMADA AIRI
分类号 G03F7/039;C08K5/00;(IPC1-7):G03F7/023 主分类号 G03F7/039
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