发明名称 METHOD FOR MEASURING OPTICAL AXIS, ANGLE, AND PATTERN OF RADIATION OF RADIATION LIGHT SOURCE
摘要 PROBLEM TO BE SOLVED: To provide a radiation light source measuring method which recognizes the angle of the optical axis of an LD from an image, recognizes in advance the position of the optical axis occupied on rectangular coordinates when looked from a reference plane of an optical semiconductor package, and enables selection of high-quality LDs, without operating a complicated driving mechanism. SOLUTION: A molten optical fiber 8 whose one end surface part forms a columnar flat end surface, and the other end surface part is squeezed like the center part of a hourglass and traverses, and is dented into a spherical shape toward an LD 1, is used. Sticking its one end surface part closely to a two-dimensional light-receiving element 7, and causing the other end surface portion to face the LD 1, light flux emitted by the LD 1 is received by the light-receiving element 7, is passed through an image processing apparatus 9, and is displayed on an image monitor 10 by analog or digital display. Consequently, a ferrule and the optical axis of the LD 1 can be easily adjusted, and an optical semiconductor module with excellent transmission efficiency can be manufactured, since the position of the optical axis B can be known in advance, when the optical semiconductor module is assembled. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004020450(A) 申请公布日期 2004.01.22
申请号 JP20020177824 申请日期 2002.06.19
申请人 SUMITOMO ELECTRIC IND LTD 发明人 KONISHI TAKANOBU;ISHII HIROYUKI
分类号 G01J1/00;G01J1/06;G01M11/00;H01L27/14;H01S5/00;(IPC1-7):G01J1/00 主分类号 G01J1/00
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