发明名称 LABEL INSPECTION METHOD AND LABEL INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To surely detect a damaged condition of a label even the label itself is transparent or translucent, and to surely detect a positional shift of the label with respect to a container under the condition when the label is in the state attached to the container. SOLUTION: This label inspection method is one by which a label L of an inspection object is irradiated with inspection light, and the inspection light after the irradiation is photoreceived to inspect the condition of the label L. There are provided a method and device for inspecting the label L by receiving the inspection light after the irradiation of the label L by imparting an ultraviolet absorbing function or an infrared absorbing function to the label L, and by using light including ultraviolet rays or infrared rays as the inspection light, a method and device for inspecting the label L by receiving the inspection light after the irradiation of the label L by imparting an ultraviolet fluorescent function to the label L, and receives the inspection light after the radiation of the label L by imparting polarization function or a rotatory function to the label L. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004012294(A) 申请公布日期 2004.01.15
申请号 JP20020166004 申请日期 2002.06.06
申请人 SUNTORY LTD 发明人 KAMAKURA RUI;YAMAGISHI TAKAHIRO;OMURA SHIGEO
分类号 G01B11/00;B65B57/02;G01N21/90;(IPC1-7):G01N21/90 主分类号 G01B11/00
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