发明名称 METHOD AND DEVICE FOR MEASURING TOPOLOGY OF OBJECT
摘要 PROBLEM TO BE SOLVED: To provide a method for measuring the topology (62) of an object (64), using an optical system (60). SOLUTION: This method includes a step of positioning the object in a measuring cell (66), a step of filling cell with fluid, a step which permeates light towards object in the measuring cell, a step of measuring the degree of illumination of object surface, a step which forms an object image, based on the degree of illumination of the surface. Prior to the positioning of the object inside the measuring cell (66), there is included a step of coating the surface (62) of the object (64) to be measured with an optically uniform film. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004004088(A) 申请公布日期 2004.01.08
申请号 JP20030151793 申请日期 2003.05.29
申请人 GENERAL ELECTRIC CO <GE> 发明人 TRANTOW RICHARD L;ROSS JOSEPH B
分类号 G01B11/24;(IPC1-7):G01B11/24 主分类号 G01B11/24
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