发明名称 Semiconductor manufacturing apparatus
摘要 Disclosed is a semiconductor exposure apparatus which includes a chamber for accommodating therein a main unit of the exposure apparatus, a gas controlling unit for controlling a gas in the chamber, a chemical filter for attracting a chemical substance in a controlling gas, and a dust removing filter for catching a dust particle in a controlling gas, wherein a gas blowing area of the chemical filter is smaller than that of the dust removing filter. wherein said chemical filter and said dust removing filter are disposed separately from each other. The chemical filter is mounted obliquely with respect to a direction of flow of a supplied gas. A gas rectifying device is disposed at a gas inlet side of the chemical filter and the dust removing filter. The chemical filter can be a pleat filter, and it is mounted so that the pleat thereof is orthogonal to the direction of flow of the supplied air. <IMAGE>
申请公布号 EP1312985(A3) 申请公布日期 2004.01.07
申请号 EP20020257942 申请日期 2002.11.18
申请人 CANON KABUSHIKI KAISHA 发明人 NAKANO, HITOSHI;ARAKAWA, KIYOSHI
分类号 B01D46/00;B01D46/10;B01D46/52;B01D53/04;F24F3/16;G03F7/20;H01L21/02;H01L21/027 主分类号 B01D46/00
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