Automatic test equipment for test and analysis of analog DFT/BIST circuitry

摘要

An analog/mixed-signal DFT/BIST test module for use in a semiconductor tester to support DFT/BIST testing of semiconductor devices having at least one analog/mixed-signal circuit-under-test is disclosed. The analog/mixed-signal circuit-under-test coupled to an on-chip test circuit having a test signal input and a test signal output. The analog/mixed-signal DFT/BIST test module includes signal source circuitry for generating test signals for application to the test signal input of the analog/mixed-signal circuit-under-test and capture circuitry for acquiring output signals from the test signal output of the analog/mixed-signal circuit-under-test. Processing circuitry responsive to user-programmed algorithms analyzes the output signals from the analog/mixed-signal circuit under test independent of the semiconductor tester host computer.