Improved construction of an electrical test probe based upon a hard pin to which the cable is connected that fits in a softer outer sleeve

摘要

The connection probe [20] has the cable [203] fitted into an inner pin [202] of hard insulating material. The wire core connects with the metallic tip probe [201]. The pin has buffer regions formed [2022] at the point of cable entry that allow bending. Projection pads [2021] allow the hard pin to fit and be retained in a relatively soft outer sleeve.