发明名称 SHAPE BASED NOISE TOLERANCE CHARACTERIZATION AND ANALYSIS OF LSI
摘要 <p>The present invention presents techniques for considering whether the effects of cross-talk coupling and other noise exceed the noise tolerance of a circuit. One aspect of the present invention uses a set of parameters to represent this noise. An exemplary embodiment uses a triangle or trapezoidal approximation to a glitch based on a set of parameters: the peak voltage value, the width, the leading edge slope and the trailing edge slope. These values are then used as the input of a library to look up the corresponding noise tolerance parameter set values. In a variation, a set of formulae can provide the noise tolerance parameter set values. In an exemplary embodiment, the noise tolerance parameter set is taken to include the minimum peak value for the noise to be possibly harmful and the minimum width value for the noise to be possibly harmful.</p>
申请公布号 WO2003105188(P1) 申请公布日期 2003.12.18
申请号 US2003016793 申请日期 2003.05.28
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