METHOD FOR COLLECTING FAILURE INFORMATION FOR A MEMORY USING EMBEDDED TEST CONTROLLER

摘要

A method of collecting failure information when testing a memory comprises: performing a test of the memory according to a test algorithm, and, while performing the test, counting failure events (114) which occur after a predetermined number of masked events (106); stopping the test upon occurrence of a stopping criterion (112) which comprises one of occurrence of a first failure event (110), a change of a test operation; a change of a memory column address; a change of a memory row address; a change of a memory bank address; and a change of a test algorithm phase; and storing failure information.