发明名称 Intelligent test point selection for bit error rate tester-based diagrams
摘要 Method and apparatus for constructing diagrams representing the relationship between variable quantities. According to the method, at least one first measurement point representing the relationship between the variable quantities is provided for initially constructing the diagram. Thereafter, at least one location is selected at which the relationship between the variable quantities is to be measured, the at least one location being selected as a function of the at least one measurement point. The relationship between the variable quantities is then measured at the at least one location to provide at least one additional measurement point for further constructing the diagram. The invention permits diagrams, such as V Curve diagrams, Bathtub Curve diagrams and Eye Diagrams, to be constructed in less time and using fewer measurement points than conventional diagram construction procedures.
申请公布号 US2003225541(A1) 申请公布日期 2003.12.04
申请号 US20020162405 申请日期 2002.06.03
申请人 ABRAMOVITCH DANIEL YVES 发明人 ABRAMOVITCH DANIEL YVES
分类号 H04L1/20;G06F15/00;G06M11/04;H04L1/24;(IPC1-7):G06F15/00 主分类号 H04L1/20
代理机构 代理人
主权项
地址