发明名称 Memory manufacturing process using bitline rapid thermal anneal
摘要 A method of manufacturing an integrated circuit includes providing a semiconductor substrate and depositing a charge-trapping dielectric layer and a gate dielectric layer over the semiconductor substrate. Bitlines are implanted closely in the semiconductor substrate and annealed using a rapid thermal anneal. Wordlines and gates are formed and source/drain junctions are implanted in the semiconductor substrate. An interlayer dielectric layer is deposited and the integrated circuit completed.
申请公布号 US6653191(B1) 申请公布日期 2003.11.25
申请号 US20020151576 申请日期 2002.05.16
申请人 ADVANCED MICRO DEVICES, INC.;FUJITSU LIMITED 发明人 YANG JEAN Y.;HALLIYAL ARVIND;JAFARPOUR AMIR H.;KAMAL TAZRIEN;RAMSBEY MARK T.;LINGUNIS EMMANUIL;SHIRAIWA HIDEHIKO
分类号 H01L21/8246;H01L27/105;H01L27/115;(IPC1-7):H01L21/824 主分类号 H01L21/8246
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