发明名称 Boosted voltage generating circuit and semiconductor memory device having the same
摘要 There are provided a boosted voltage generating circuit and a semiconductor memory device having the boosted voltage generating circuit which includes a booster circuit for outputting high voltage obtained by boosting the power supply voltage, a regulator circuit supplied with the high voltage, for generating voltage whose voltage value is smaller than the value of the high voltage and which is variably set to at least two values based on the high voltage at the operating time, and a equalizer circuit connected to the booster circuit and regulator circuit, for short-circuiting an output node of the booster circuit and an output node of the regulator circuit in response to a first control signal, wherein the operative period of the regulator circuit and the short-circuiting operation period of the equalizer circuit do not overlap each other.
申请公布号 US2003210089(A1) 申请公布日期 2003.11.13
申请号 US20030464462 申请日期 2003.06.19
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TANZAWA TORU;MIYABA TAKESHI;ATSUMI SHIGERU
分类号 G06F1/26;G11C5/14;G11C16/06;G11C16/12;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G05F3/02 主分类号 G06F1/26
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