发明名称 Method and apparatus for controlling electron beam motion based on calibration information
摘要 A method for calibrating an imaging system, the system including an array (760) of detector elements arranged with respect to a reference position and having an energy source (710) moving in a pattern to irradiate the array (760) of detector elements. The method includes initiating estimated detector positions for the array (760) of detector elements and an estimated motion pattern for the energy source (710) defined with respect to a reference position. The method also includes scanning a phantom having pins located at positions in the phantom. The method further includes calculating estimated pin positions, with respect to the reference position, based on at least one of the estimated detector positions and motion pattern and modifying at least one of the estimated detector positions and pin positions based on at least two of the estimated detector positions, motion pattern and pin positions. The method also includes determining variation in the motion pattern based on at least one of the estimated detector positions and pin positions and adjusting (780,790) the motion pattern for the energy source (710) based on the variation. <IMAGE>A method for calibrating an imaging system, the system including an array (760) of detector elements arranged with respect to a reference position and having an energy source (710) moving in a pattern to irradiate the array (760) of detector elements. The method includes initiating estimated detector positions for the array (760) of detector elements and an estimated motion pattern for the energy source (710) defined with respect to a reference position. The method also includes scanning a phantom having pins located at positions in the phantom. The method further includes calculating estimated pin positions, with respect to the reference position, based on at least one of the estimated detector positions and motion pattern and modifying at least one of the estimated detector positions and pin positions based on at least two of the estimated detector positions, motion pattern and pin positions. The method also includes determining variation in the motion pattern based on at least one of the estimated detector positions and pin positions and adjusting (780,790) the motion pattern for the energy source (710) based on the variation. <IMAGE>
申请公布号 EP1346689(A2) 申请公布日期 2003.09.24
申请号 EP20030251120 申请日期 2003.02.25
申请人 GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY COMPANY LLC 发明人 CHELL, ERIK;COUCH, JOHN;MAGNUSON, PAUL
分类号 G01T1/17;A61B6/00;A61B6/03;G01R31/305;G01S7/52;(IPC1-7):A61B6/00 主分类号 G01T1/17
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