发明名称 Contact plug in capacitor device
摘要 A semiconductor device comprises a first insulating film formed over a semiconductor substrate, a second insulating film formed on the first insulating film, a contact plug made of a conductive material vertically penetrating the first and second insulating films and extending on the second insulating film, and a conductor film in contact with the upper surface of the contact plug and part of the second insulating film. This construction makes it possible to form minute via-holes in a mass-production line without increasing parasitic capacity, increasing the number of manufacturing steps, and generating defects.
申请公布号 US6624525(B2) 申请公布日期 2003.09.23
申请号 US20020091289 申请日期 2002.03.06
申请人 FUJITSU LIMITED 发明人 ANEZAKI TORU;IKEMASU SHINICHIROH
分类号 H01L21/302;H01L21/02;H01L21/3065;H01L21/316;H01L21/318;H01L21/60;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108;H01L29/76 主分类号 H01L21/302
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