发明名称 Method for fabricating field-effect transistors in integrated semiconductor circuits and integrated semiconductor circuit fabricated with a field-effect transistor of this type including a dual gate
摘要 A method for fabricating a field-effect transistor situated within an integrated semiconductor circuit. At least two gate regions each extending between a source region and a drain region and are disposed such that they lie one above the other in a thickness direction of a substrate, thereby reducing the space requirement of the hitherto customary larger field-effect transistors in integrated semiconductor circuits.
申请公布号 US6613616(B2) 申请公布日期 2003.09.02
申请号 US20010951241 申请日期 2001.09.12
申请人 INFINEON TECHNOLOGIES AG 发明人 ANGERMANN WOLFGANG;BAENISCH ANDREAS
分类号 H01L29/41;H01L21/8234;H01L27/088;H01L29/78;(IPC1-7):H01L21/00;H01L21/336;H01L21/476;H01L21/84;H01L21/320 主分类号 H01L29/41
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