发明名称 APPARATUS FOR MANAGING INSPECTION SAMPLE TEMPERATURE FOR MICROSCOPE OBSERVATION
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for managing inspection sample temperatures for microscopic observation which can suppress the amount of distortion of a heating transparent plate accompanying temperature control to the smallest possible level and does not give rise to a blur of an image even if a microscope of a high magnification is used. SOLUTION: The apparatus has a voltage adjuster 23 which adjusts the power-supply voltage inputted from an external AC power source (commercial) to the necessary and lowest possible voltage for maintaining the heating transparent plate 5 at a set temperature according to the temperature information from a room temperature sensor 15 and supplies the electric power corresponding to the output voltage from the voltage adjuster 23 to a resistance heat generating transparent conductive film 9. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003241108(A) 申请公布日期 2003.08.27
申请号 JP20020044288 申请日期 2002.02.21
申请人 TOKAI HIT:KK 发明人 TSUCHIYA HIDEJI
分类号 G02B21/30;(IPC1-7):G02B21/30 主分类号 G02B21/30
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