发明名称 METHOD FOR CORRECTING MEASUREMENT ERROR, METHOD FOR DETERMINING QUALITY OF ELECTRONIC COMPONENT, AND INSTRUMENT FOR MEASURING CHARACTERISTIC OF ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To correct measurement results of actual measurement, whose measurement results do not completely agree with those measured by a referential measuring instrument, so that they are equal to the measurement result of the measuring instrument. SOLUTION: Electrical characteristics of a specimen 11B for acquiring correction data are measured by the referential measuring instrument 1 and by a measuring instrument 2 for actual measurement, respectively, and then an expression of interrelation is found between measurement results by the instrument 2 and measurement results by the instrument 2. For calculation, electrical characteristics of an electric component 11A, or an object of measurement, measured by using the instrument 2 are applied to the expression. The electrical characteristics of the component 11A are corrected into electrical characteristics that are presumably obtained if measurement is made by the instrument 1. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003240827(A) 申请公布日期 2003.08.27
申请号 JP20020277393 申请日期 2002.09.24
申请人 MURATA MFG CO LTD 发明人 KAMIYA TAKESHI
分类号 G01R27/28;G01R31/316;G01R35/00;H05K13/00;(IPC1-7):G01R31/316 主分类号 G01R27/28
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