| 摘要 |
PROBLEM TO BE SOLVED: To provide a device for characterizing a nonlinear operation of an examined device under inconsistent load environments, and performing the measurement for leading a nonlinear scattering function. SOLUTION: This device collects an RF signal measured data in signal ports 1, 2 of the RF examine object device and the microwave examine object device. This device includes a means 6 for measuring an incident RF signal and a reflection RF signal in the signal ports 1, 2 of the DUT 3, waveform synthesizing means 10, 11, 18 for generating an RF signal of the basic frequency and the harmonic component of the basic frequency, tuning means 24, 25 for applying the load to provide the DUT 3 with various impedance conditions on the basic frequency and the harmonic component, and means 12-16, 19-23 for supplying the RF signal of the waveform synthesizing means 10, 11, 18 to the signal ports 1, 2 of the DUT 3. This device can be formed as a part of a nonlinear network measuring system (NNMS). COPYRIGHT: (C)2003,JPO
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