发明名称 Drying system for drying semiconductor wafers and method of drying wafers using the same
摘要 A method of and system for drying a wafer offer a short cycle of operation, and minimize the amount of time that the wafer is exposed to external air. The drying system includes a process bath, a loader for transferring the wafer from a wash bath to an elevator of the process bath, an unloading stage for supporting the wafer after it is dried, and a lid for drying the wafer after it is rinsed in the process bath and for transferring the wafer onto the unloading stage. The lid includes a lid body defining a cavity, a wafer holder disposed within the cavity, a gas distributer having gas injection holes facing the cavity, and a driving mechanism for moving the lid between the process bath and the unloading stage. In the drying method, the lid is positioned over the process bath after the wafer has been rinsed. The elevator of the process bath is then raised to move the rinsed wafer above the tub of the process bath and into the cavity defined in the lid body. Next, the wafer is secured to the lid, within the cavity, by the wafer holder. A dried gas is then injected by the gas distributer into the cavity of the lid and onto the wafer, thereby drying the wafer. Finally, the lid is moved to the unloading stage where the wafer is released by the wafer holder.
申请公布号 US6589360(B2) 申请公布日期 2003.07.08
申请号 US20010878969 申请日期 2001.06.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON PYEONG SIK;CHOI HYOUNG CHUL
分类号 H01L21/304;B08B3/04;H01L21/00;(IPC1-7):B08B3/00 主分类号 H01L21/304
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