发明名称 POROUS LOW-K DIELECTRIC INTERCONNECT STRUCTURES
摘要 The present invention provides an electrical interconnect structure on a substrate, includes a first porous dielectric layer with surface region from which a porogen has been removed; and an etch stop layer disposed upon the first porous dielectric layer so that the etch stop layer extends to partially fill pores in the surface region of the first porous dielectric layer from which the porogen has been removed, thus improving adhesion during subsequent processing. Another structure comprises a substrate; a plurality of porous dielectric layers disposed on the substrate; an etch stop layer disposed between a first of the dielectric layers and a second of the dielectric layers; and at least one thin, tough, non-porous dielectric layer disposed between at least one of the porous dielectric layers and the etch stop layer. Methods of forming these structures are also provided.
申请公布号 WO03054928(A2) 申请公布日期 2003.07.03
申请号 WO2002US40020 申请日期 2002.12.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FORNOF, ANN, R.;HEDRICK, JEFFREY, C.;LEE, KANG-WOOK;MALONE, KELLY;TYBERG, CHRISTY, S.
分类号 H01L21/316;H01L21/768;H01L23/522;H01L23/532 主分类号 H01L21/316
代理机构 代理人
主权项
地址