| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit test device and method, capable of improving the efficiency of a test. SOLUTION: In this semiconductor integrated circuit test device having a test station 21 and a test station 31, when the test station 31 is in the standby state of being ready for testing during testing of the test station 21, testing of the test station 21 is forcibly ended, and then testing at the test station 21 and the test station 31 is simultaneously started. COPYRIGHT: (C)2003,JPO
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