发明名称 SAMPLE HOLDER FOR X-RAY DIFFRACTION MEASUREMENT AND SAMPLE FIXING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a sample holder and a sample fixing method which can both prevent powder sample from being oriented and fix the height of a measurement face to a fixed height in X-ray diffraction measurement. SOLUTION: The sample holder comprises a plate having a through-hole, an organic film attached to one face of the plate by fixing agent so as to close the through-hole and a collodion thin film adhering to the inner surface of the organic film so as to fix the powder sample. The sample fixing method attaches the organic film to one face having the through-hole by the fixing agent, and fix the collodion thin film adhering to the inner surface of the organic film to the powder sample.</p>
申请公布号 JP2003149174(A) 申请公布日期 2003.05.21
申请号 JP20010342728 申请日期 2001.11.08
申请人 SUMITOMO METAL MINING CO LTD 发明人 HAYASHI KAZUHIDE
分类号 G01N23/20;(IPC1-7):G01N23/20 主分类号 G01N23/20
代理机构 代理人
主权项
地址