发明名称 Method of forming a quantum dot and a gate electrode using the same
摘要 In a method of forming a quantum dot having nanometeric size and a method of forming a gate electrode including the quantum dot, a first layer including a first material is deposited on the substrate. The first material has first atoms that are superbundant and bound with the weak bonding energy in the first layer. A second layer is deposited on the first layer. The second layer comprises a second material including second atoms that are capable of migrating into the first atoms. The first atoms are migrated into the second layer and the second atoms are migrated into the first layer, so that the second atoms are arranged in the first layer. Each of the second atoms in the first layer is formed into a quantum dot. An electrode layer is formed on the first layer after partially etching the second layer, and then a gate electrode is formed by patterning the electrode layer. Accordingly, The quantum dot can be formed in the semiconductor device in such a manner that a size and a distribution of the quantum dot is easily controlled.
申请公布号 US2003092227(A1) 申请公布日期 2003.05.15
申请号 US20020243956 申请日期 2002.09.16
申请人 LEE JANG-EUN;PARK SUN-HOO;SON JUNG-HOON 发明人 LEE JANG-EUN;PARK SUN-HOO;SON JUNG-HOON
分类号 H01L29/78;H01L21/8239;H01L21/8242;H01L27/105;(IPC1-7):H01L21/336;H01L21/823 主分类号 H01L29/78
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