发明名称 |
Enhanced resolution matrix-laser desorption and ionization TOF-MS sample surface |
摘要 |
A thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, comprising a matrix material in a supported dispersion wherein the support is a solid or is formed from a solid. The invention is also directed to a method of making a thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, the layer comprising a matrix-solid composition disposed upon a substrate, comprising the step of depositing a solution containing matrix, solid and solvent upon a spinning substrate at a deposition rate sufficient to allow evaporation of the solvent, thereby interspersing the matrix and support on the substrate in a thin layer. Enhanced mass resolution is described.
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申请公布号 |
US6558744(B2) |
申请公布日期 |
2003.05.06 |
申请号 |
US20000552453 |
申请日期 |
2000.04.18 |
申请人 |
WATERS INVESTMENTS LIMITED |
发明人 |
JARRELL JOSEPH A.;TOMANY MICHAEL J.;DORSCHEL CRAIG A. |
分类号 |
B01D59/28;B05D3/00;B05D3/02;B05D3/06;B32B5/16;(IPC1-7):B05D3/02 |
主分类号 |
B01D59/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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