发明名称 Enhanced resolution matrix-laser desorption and ionization TOF-MS sample surface
摘要 A thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, comprising a matrix material in a supported dispersion wherein the support is a solid or is formed from a solid. The invention is also directed to a method of making a thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, the layer comprising a matrix-solid composition disposed upon a substrate, comprising the step of depositing a solution containing matrix, solid and solvent upon a spinning substrate at a deposition rate sufficient to allow evaporation of the solvent, thereby interspersing the matrix and support on the substrate in a thin layer. Enhanced mass resolution is described.
申请公布号 US6558744(B2) 申请公布日期 2003.05.06
申请号 US20000552453 申请日期 2000.04.18
申请人 WATERS INVESTMENTS LIMITED 发明人 JARRELL JOSEPH A.;TOMANY MICHAEL J.;DORSCHEL CRAIG A.
分类号 B01D59/28;B05D3/00;B05D3/02;B05D3/06;B32B5/16;(IPC1-7):B05D3/02 主分类号 B01D59/28
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