发明名称 TIMING GENERATOR, SEMICONDUCTOR TESTING DEVICE, AND TIMING GENERATING METHOD
摘要 <p>A timing generator comprising a reference signal generating unit for generating a specified frequency, a variable delay circuit unit for outputting a timing signal delayed a specified time from a reference signal, and a delay measuring unit for measuring a delay by the variable delay circuit unit, a delay by the variable delay circuit unit being controlled based on a delay measured by the delay measuring unit, wherein the frequency of a reference signal is continuously modulated within a micro-frequency range to allow the delay measuring unit to accurately measure a delay by the variable delay circuit unit. A delay by the variable delay circuit unit controlled based on a measured delay can produce a timing signal delayed accurately.</p>
申请公布号 WO2003036314(P1) 申请公布日期 2003.05.01
申请号 JP2002011053 申请日期 2002.10.24
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