发明名称 |
SEMICONDUCTOR MEMORY DEVICE HAVING DISTURB TEST CIRCUIT |
摘要 |
In a semiconductor memory device having normal circuit blocks (NBL) and a redundant circuit block (RBL) for replacement, a test mode setting unit (14, 19) sets a spare non-selection mode (TMSPROFF) and enables to restore an original address of a normal circuit (DE) in a state before executing a replacement to thereby implement a disturb test even after the replacement.
|
申请公布号 |
US2003072190(A1) |
申请公布日期 |
2003.04.17 |
申请号 |
US20010976116 |
申请日期 |
2001.10.15 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
MIKI TAKEO;FURUTANI KIYOHIRO |
分类号 |
G11C29/50;(IPC1-7):G11C7/00 |
主分类号 |
G11C29/50 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|