发明名称 VISUAL INSPECTION MARK AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To remove rejectable products with high accuracy in a visual inspection process and to lessen the load in a microscopic inspection process following to connection work of a display panel, a TAB substrate and a flexible substrate. SOLUTION: In the interconnecting regions 11, 12, 13 and 14 of a panel substrate 10, TAB substrates 2 and 3, and a flexible substrate 4, visual inspection marks 15a-15d, 20a-20d, 30a-30d and 40a-40d are provided for respective members at the positions separated by a set distance from the connecting regions.
申请公布号 JP2003086999(A) 申请公布日期 2003.03.20
申请号 JP20010279532 申请日期 2001.09.14
申请人 TOHOKU PIONEER CORP 发明人 OHAZAMA HIDETAKA
分类号 G02F1/1345;G01R31/04;G09F9/00;H01L21/60;H01L51/50;H05B33/12;H05K1/02;H05K3/00;H05K3/36;H05K13/08 主分类号 G02F1/1345
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