发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To obtain a reliable, highly integrated, and high-performance semiconductor device in a large-sized glass substrate to be mass-produced using a simple manufacturing process. SOLUTION: Phosphor 117 that is an impurity selectively selected from 5-group B is introduced to a partial region (high-concentration impurity region) 108b of a crystalline silicon film 108, which is crystallized by heating and treating an a-Si film 103, where nickel 105 that is a small amount of catalyst element for accelerating crystallization is introduced. Second heat treatment is made to move the nickel 105 contained in a region (an active region) 108a, where the phosphor 117 of the crystalline silicon film 108 if not introduced to the highly-doped region. The second heat treatment is carried out so that the concentration of the nickel 105 contained in the active region 108a and contained in the highly-doped region 108b at least do not reach the segregated state of thermal equilibrium state.
申请公布号 JP2003077832(A) 申请公布日期 2003.03.14
申请号 JP20010262486 申请日期 2001.08.30
申请人 SHARP CORP 发明人 MAKITA NAOKI
分类号 G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20;G02F1/136 主分类号 G02F1/1368
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