发明名称 SOLID STATE IMAGING DEVICE
摘要 PROBLEM TO BE SOLVED: To easily and surely prevent a protective glass from being brought into contact with a wire at a protective glass mounting time at a photodetector of a solid state imaging element in a solid state imaging device in which the imaging element is mounted on a substrate. SOLUTION: The solid state imaging device comprises the solid state imaging element having the photodetector and an I/O signal unit, the protective glass mounted to cover the photodetector of the imaging element, the substrate having the imaging element mounted thereon and an electrode pattern formed at a position opposed to the I/O signal unit, and wirings for connecting a plurality of electrode patterns disposed on the I/O signal unit to a plurality of electrode patterns disposed on the electrode pattern. The imaging device further comprises a wiring protecting means for preventing the protective glass from being brought into contact with the wiring at the time of mounting the glass on the imaging element.
申请公布号 JP2003060175(A) 申请公布日期 2003.02.28
申请号 JP20010240196 申请日期 2001.08.08
申请人 NIKON CORP 发明人 WAKABAYASHI ATSUSHI
分类号 H01L27/14;H01L21/60 主分类号 H01L27/14
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