Testing method for memory circuit evaluates effect on other word lines of selective word line activation and de-activation

摘要

The testing method has at least one word line (102a-102N) of the tested memory circuit (101) activated by application of a test signal (103), with subsequent de-activation of the word line by removal of the test signal and evalaution of the effect of the activation and the de-activation on other word lines for delivery of a test result. An Independent claim for a testing device for a memory circuit is also included.