发明名称 METHOD OF PROGRAMMING/READING MULTI-LEVEL FLASH MEMORY USING SENSING CIRCUIT
摘要 <p>PROBLEM TO BE SOLVED: To provide a multi-level flash memory programming method using a sensing circuit and a reading-method therefor. SOLUTION: First word line voltage Vp1 is applied to a memory cell and a reference cell (S102). Vp1 is intermediate voltage which is higher than a threshold voltage of a cell and lower than a threshold voltage of a third level. When Vp1 is applied, a first cell is specified (S103), further, it is decided whether the cell is programmed or not (S104). A program is performed by an automatic verification program method to raise the threshold voltage of the cell to a second level (S105). Further, when the prescribed operation is all completed based on data stored in a register, a cell number is increased (S106), a second level program stage is finished, and operation is shifted to a third level program stage (S107).</p>
申请公布号 JP2003022683(A) 申请公布日期 2003.01.24
申请号 JP20010384110 申请日期 2001.12.18
申请人 HYNIX SEMICONDUCTOR INC 发明人 HO CHANG SEUNG
分类号 G11C16/02;G11C11/56;G11C16/06;G11C16/26;(IPC1-7):G11C16/02 主分类号 G11C16/02
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