A method of depositing crystallographically orientated aluminium nitride. Aluminium nitride is sputter deposited from a target on a workpiece maintained on a biased platen. The sputter gas is or includes krypton or xenon. The bias to the platen is selected to give a substantially flat XRD FWHM profile across the wafer and a stress in the film of less than or equal to +/- 5E10-8 dynes per cm<2>.
申请公布号
WO03006701(A1)
申请公布日期
2003.01.23
申请号
WO2002GB02946
申请日期
2002.06.20
申请人
TRIKON HOLDINGS LIMITED;RICH, PAUL;WIGGINS, CLAIRE, LOUISE