发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: To provide a reliable nonvolatile semiconductor memory device. CONSTITUTION: The nonvolatile semiconductor memory device comprises a capacitor 250. The capacitor comprises a lower electrode 203, a second dielectric layer 204, and an upper electrode 205 having a part formed on the lower electrode 203 through the second dielectric layer 204. The upper electrode 205 comprises a first top face 241t positioned in a part relatively far from a silicon wafer 1, and a second top face 242t positioned in a part relatively close to the silicon wafer 1. The second dielectric layer 204 has a structure laminating a first silicon oxide film 104a, a silicon nitride film 104b, and a second silicon oxide film 104c in this order.
申请公布号 KR20030006942(A) 申请公布日期 2003.01.23
申请号 KR20020020559 申请日期 2002.04.16
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 FUKUMOTO ATSUSHI;SHIMIZU SATOSHI
分类号 H01L21/8247;H01L27/10;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L27/115;H01L21/824 主分类号 H01L21/8247
代理机构 代理人
主权项
地址