发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: To provide a reliable nonvolatile semiconductor memory device. CONSTITUTION: The nonvolatile semiconductor memory device comprises a capacitor 250. The capacitor comprises a lower electrode 203, a second dielectric layer 204, and an upper electrode 205 having a part formed on the lower electrode 203 through the second dielectric layer 204. The upper electrode 205 comprises a first top face 241t positioned in a part relatively far from a silicon wafer 1, and a second top face 242t positioned in a part relatively close to the silicon wafer 1. The second dielectric layer 204 has a structure laminating a first silicon oxide film 104a, a silicon nitride film 104b, and a second silicon oxide film 104c in this order.
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申请公布号 |
KR20030006942(A) |
申请公布日期 |
2003.01.23 |
申请号 |
KR20020020559 |
申请日期 |
2002.04.16 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
FUKUMOTO ATSUSHI;SHIMIZU SATOSHI |
分类号 |
H01L21/8247;H01L27/10;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L27/115;H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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