发明名称 MICRO-TESTING DEVICE FOR FRICTION AND ABRASION OF FLAT SPECIMEN
摘要 PURPOSE: A micro-testing device is provided to allow a high precision control and continuous control for the size and cycle of loading applied for the analysis of friction and abrasion of the flat specimen. CONSTITUTION: A micro-testing device comprises a fixing unit(100) having a base(130) where a pair of first columns(110) and a pair of second columns(120) are coupled in a vertical direction; a driving unit having a stainless tube coupled in a horizontal direction to the fixing unit, and a flat specimen support(230) reciprocating in a horizontal direction by the operation of a first voice coil motor(220) coupled to an end of the stainless tube; a rotating plate position control unit having a rotating plate(320) coupled in a vertical direction to a coil motor which is coupled to second columns; a ball specimen support(400) having a ball specimen coupled to an end of a load plate which is coupled in a horizontal direction to the rotating plate, and a balancing weight coupled to the other end of the load plate; a ball specimen control unit(500) coupled to the top of the second column, which controls movement of the ball specimen support; a measurement unit(600) arranged on the fixing unit, which measures frictional force of the flat specimen by scanning light to a reflector mirror; and a power unit(700) arranged on the base, which supplies power to the driving unit, the rotating plate position control unit and the measurement unit.
申请公布号 KR20030002220(A) 申请公布日期 2003.01.08
申请号 KR20010038974 申请日期 2001.06.30
申请人 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 AHN, HYO SEOK;DUBRAVIN ANDREI M;KIM, CHUNG HYEON;KOMKOV OLEG Y;MYSHKIN NIKOLAI K
分类号 G01N3/02;G01N3/06;G01N3/56;G01N19/02;(IPC1-7):G01N3/56 主分类号 G01N3/02
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