发明名称 |
MICRO-TESTING DEVICE FOR FRICTION AND ABRASION OF FLAT SPECIMEN |
摘要 |
PURPOSE: A micro-testing device is provided to allow a high precision control and continuous control for the size and cycle of loading applied for the analysis of friction and abrasion of the flat specimen. CONSTITUTION: A micro-testing device comprises a fixing unit(100) having a base(130) where a pair of first columns(110) and a pair of second columns(120) are coupled in a vertical direction; a driving unit having a stainless tube coupled in a horizontal direction to the fixing unit, and a flat specimen support(230) reciprocating in a horizontal direction by the operation of a first voice coil motor(220) coupled to an end of the stainless tube; a rotating plate position control unit having a rotating plate(320) coupled in a vertical direction to a coil motor which is coupled to second columns; a ball specimen support(400) having a ball specimen coupled to an end of a load plate which is coupled in a horizontal direction to the rotating plate, and a balancing weight coupled to the other end of the load plate; a ball specimen control unit(500) coupled to the top of the second column, which controls movement of the ball specimen support; a measurement unit(600) arranged on the fixing unit, which measures frictional force of the flat specimen by scanning light to a reflector mirror; and a power unit(700) arranged on the base, which supplies power to the driving unit, the rotating plate position control unit and the measurement unit.
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申请公布号 |
KR20030002220(A) |
申请公布日期 |
2003.01.08 |
申请号 |
KR20010038974 |
申请日期 |
2001.06.30 |
申请人 |
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
AHN, HYO SEOK;DUBRAVIN ANDREI M;KIM, CHUNG HYEON;KOMKOV OLEG Y;MYSHKIN NIKOLAI K |
分类号 |
G01N3/02;G01N3/06;G01N3/56;G01N19/02;(IPC1-7):G01N3/56 |
主分类号 |
G01N3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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