发明名称 |
METAL INTERCONNECTION IN SEMICONDUCTOR DEVICE HAVING DOUBLE METAL LAYERS AND METHOD FOR FORMING THE SAME |
摘要 |
PURPOSE: A metal interconnection in semiconductor device having double metal layers and a method for forming the same are provided to improve throughput and characteristic of device and achieve simplification of process. CONSTITUTION: An interlayer dielectric(21) including a metal contact(22) is formed on a semiconductor substrate(20). A first metal layer is formed on the interlayer dielectric in order to bury the metal contact. A second metal layer is formed on the first metal layer.
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申请公布号 |
KR20020095715(A) |
申请公布日期 |
2002.12.28 |
申请号 |
KR20010033897 |
申请日期 |
2001.06.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SEONG YEONG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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