发明名称 METAL INTERCONNECTION IN SEMICONDUCTOR DEVICE HAVING DOUBLE METAL LAYERS AND METHOD FOR FORMING THE SAME
摘要 PURPOSE: A metal interconnection in semiconductor device having double metal layers and a method for forming the same are provided to improve throughput and characteristic of device and achieve simplification of process. CONSTITUTION: An interlayer dielectric(21) including a metal contact(22) is formed on a semiconductor substrate(20). A first metal layer is formed on the interlayer dielectric in order to bury the metal contact. A second metal layer is formed on the first metal layer.
申请公布号 KR20020095715(A) 申请公布日期 2002.12.28
申请号 KR20010033897 申请日期 2001.06.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SEONG YEONG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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