发明名称 ALIGNER AND MICRODEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an aligner, having an illumination optical system capable of dealing with the refining of the line width of the image of a mask pattern, which is projected on a photosensitive substrate to expose the substrate to the image. SOLUTION: The aligner has a surface light-source forming means 6 for subjecting luminous flux from a light source 1 to a wavefront division to form a surface light-source; a condenser optical system 4 for illuminating a mask pattern M, based on the surface light-source formed by the surface light-source forming means 6; and a projecting optical system for projecting the image of the mask pattern M on a photosensitive substrate W. In the aligner, the surface light-source forming means 6 has a plurality of elementary lenses disposed in parallel with each other, and the luminous flux from the light source 1 is projected on each elementary lens from the inclining direction to the optical axis of each elementary lens, so that it is reflected by the side surface of each elementary lens.
申请公布号 JP2002343695(A) 申请公布日期 2002.11.29
申请号 JP20010141171 申请日期 2001.05.11
申请人 NIKON CORP 发明人 KOMATSUDA HIDEKI
分类号 G02B5/08;G02B3/00;G02B5/18;G02B17/08;G02B19/00;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G02B5/08
代理机构 代理人
主权项
地址