发明名称 TEST PATTERN PRODUCING DEVICE, SIMULATION RESULT ANALYZING DEVICE AND LSI SIMULATING SYSTEM
摘要 PROBLEM TO BE SOLVED: To make a forming of a new test pattern for additional confirmation items, during executing of simulation through manual operation unnecessary, by dispensing the preparation of the test pattern beforehand. SOLUTION: In the device, an operation item data 13, for operating a basic test pattern 12, is produced by a test pattern producing device 1, data to write into the basic test pattern 12, according to the data, and the output method indication data of the basic test pattern 12 are produced, the data to be written is written into the basic test pattern 12 and made to be a test pattern 15, the test pattern 15 is outputted according to the output method indicating data, the test pattern 15 is inputted and simulated by a simulation executing means 2 and simulation results 16 are outputted. In this case, a part, containing the analyzed subject which is specified before hand among the simulation results 16, is extracted by a simulation result analyzing device 3, is observed, the subject of analysis is analyzed, and the result is displayed.
申请公布号 JP2002288259(A) 申请公布日期 2002.10.04
申请号 JP20010085628 申请日期 2001.03.23
申请人 NEC MIYAGI LTD 发明人 YOKOYAMA KOJI
分类号 G01R31/28;G01R31/3183;G06F17/50;H01L21/82;(IPC1-7):G06F17/50;G01R31/318 主分类号 G01R31/28
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