发明名称 TOMOGRAPHIC WAVEFRONT ANALYSIS SYSTEM
摘要 <p>A method of measuring aberrations of a three-dimensional structure of an optical system, such as an eye, includes creating a plurality of light beams, optically imaging the light beams and projecting the light beams onto different locations in an optical system, receiving scattered light from each of the locations, and detecting individual wavefronts of the scattered light. The plurality of light beams may be created and projected simultaneously or sequentially. A system for measuring aberrations of a three-dimensional structure of an optical system includes a light source (112) creating a plurality of light beams, an optical imaging system (120) optically imaging the light beams and projecting the light beams onto different locations in the target optical system, and a wavefront sensor (130) receiving scattered light from each of the locations and detecting individual wavefronts of the scattered light.</p>
申请公布号 WO2002075367(A2) 申请公布日期 2002.09.26
申请号 US2002007573 申请日期 2002.03.14
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