发明名称 Semiconductor device having contact using crack-protecting layer and method of forming the same
摘要 A semiconductor device having a contact using a crack-protecting layer and a method of forming the same are provided. The crack-protecting layer formed of a dielectric material is formed on an interlayer dielectric layer. The crack-protecting layer relieves or absorbs residual stress generated on a conductive layer used in forming a contact plug. Thus, a contact can be formed without damage to the interlayer dielectric layer due to residual stress.
申请公布号 US2002125543(A1) 申请公布日期 2002.09.12
申请号 US20010055260 申请日期 2001.10.26
申请人 SAMSUNG ELECTRONICS CO. LTD. 发明人 MOON KWANG-JIN;PARK HEE-SOOK;LEE MYOUNG-BUM
分类号 H01L21/28;H01L21/3205;H01L21/768;(IPC1-7):H01L29/00 主分类号 H01L21/28
代理机构 代理人
主权项
地址