发明名称 High speed parallel bit error rate tester
摘要 A high speed link between chips and comprising a multiplicity of synchronous serial data channels includes an onboard detector for detecting an error rate for each channel. The transmitter and the receiver chips are configured in response to the detector to select the channel having the lowest error rate as the control channel and optionally to render at least the channel with the highest error rate inactive.
申请公布号 US6438717(B1) 申请公布日期 2002.08.20
申请号 US19990436350 申请日期 1999.11.09
申请人 3COM CORPORATION 发明人 BUTLER JOSEPH N;HUGHES MARK A;FANNING NEIL O;O'NEILL EUGENE;QUINLAN UNA
分类号 H04L1/00;H04L25/14;(IPC1-7):G06F11/00;G01R31/28 主分类号 H04L1/00
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