发明名称 Cell capacitors, memory cells, memory arrays, and method of fabrication
摘要 A masking and etching technique during the formation of a memory cell capacitor which utilizes an etching technique to utilize a maximum surface area over the memory cell and to form thin spacers to pattern separation walls between capacitors. This technique results in efficient space utilization which, in turn, results in an increase in the surface area of the capacitor for an increased memory cell capacitance.
申请公布号 US6429475(B1) 申请公布日期 2002.08.06
申请号 US20000645251 申请日期 2000.08.24
申请人 MICRON TECHNOLOGY, INC. 发明人 CLAMPITT DARWIN A.
分类号 H01L21/02;H01L21/8242;H01L27/108;(IPC1-7):H01L29/72 主分类号 H01L21/02
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