发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PURPOSE: To suppress the generation of the package crack of a semiconductor chip on an upper side and the deterioration of the reliability of connection in a semiconductor device for which two semiconductor chips are joined and packaged. CONSTITUTION: In this semiconductor device functioning as a three-dimensional device for which two semiconductor chips are joined, the back surface of the semiconductor chip on the upper side is ground, the entire side face of the semiconductor chip on the upper side is covered with a resin layer, or the center of the semiconductor chip on the upper side is made thicker than a peripheral part. Thus, the generation of the package crack is suppressed and the reliability of the semiconductor device is improved.
申请公布号 KR20020053011(A) 申请公布日期 2002.07.04
申请号 KR20010084671 申请日期 2001.12.26
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 KANEKO HIDEYUKI;MATSUMURA KAZUHIKO;NAGAO KOICHI;NAKAOKA YUKIO
分类号 H01L23/28;H01L21/304;H01L21/56;H01L21/98;H01L23/12;H01L23/29;H01L23/31;H01L25/065;H01L25/07;H01L25/18;H01L29/06 主分类号 H01L23/28
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