| 摘要 |
PURPOSE: A method for testing an integrated circuit is provided to easily achieve the testing by using an internal signal without using an additional internal measuring pad and output pin. CONSTITUTION: The integrated circuit(IC) is to apply the output signals from a circuit unit as test signals to a signal output of the integrated circuit provided that, at the signal output, an externally applied potential value, which can be set by means of an external resistor for example, corresponds to a defined reference value. The integrated circuit(IC) has an input pin(IN) and an output pin(OUT) for this purpose. The output pin(OUT) is externally linked to a reference potential(RV) via a node(100) which is connected to a resistor(W1) by means of a switch(T1) or to a resistor(W2) by means of a switch(T2). Furthermore, the integrated circuit has another pin at which a supply voltage(VS) is available and a pin which is linked to the reference potential(RV).
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