发明名称 |
Apparatus and method for measuring hall effect |
摘要 |
<p>Disclosed are apparatus and method for measuring Hall effect related-values in a semiconductor, such as a mobility, a carrier concentration and a resistivity using a Hall effect. A sample (S) is loaded into a IC socket (20) or a similar target, which is fixed on the inside of a heat insulating material container capable of containing injected liquid nitrogen. The Hall effect related-values are measured using a moving member (60) for moving a pair of permanent magnets (M1,M2) to an outside of the heat insulating material container. The measuring equipment has a simple structure, and a measuring operation is simple. A level of an imput voltage of a sample is measured depending on a constant current that is supplied by a constant current supplying unit contained in a Hall voltage measurement unit. A measurement error detection unit detects and displays a measurement error of the sample using the level of the measured input voltage. Since the measurement error is detected before measuring the Hall effect, the measurement error can be excluded. <IMAGE></p> |
申请公布号 |
EP1211517(A2) |
申请公布日期 |
2002.06.05 |
申请号 |
EP20010310077 |
申请日期 |
2001.11.30 |
申请人 |
EVERGREEN KOREA CORP. |
发明人 |
KIM, HOON;NAGAMUNE, YASUSHI;LEE, GEUN-TAEK;CHUNG, SUK-HWAN |
分类号 |
H01L43/14;G01R33/12;(IPC1-7):G01R33/12 |
主分类号 |
H01L43/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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