发明名称 |
METHOD FOR STRUCTURING SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide an ion etching method which does not include the supply of a fluorinated organic compound gas. SOLUTION: The method for structuring a substrate having a construction of micrometer or nanometer region does not include the supply of a fluorinated organic compound gas. The method is performed by a reactive ion etching by using a mask, plasma and a fluorinated organic compound arranged on a substrate, and the fluorinated organic compound is provided in solid polymer form. A method for etching the coating on the substrate of the surface of the substrate is also provided.
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申请公布号 |
JP2002141330(A) |
申请公布日期 |
2002.05.17 |
申请号 |
JP20010281467 |
申请日期 |
2001.09.17 |
申请人 |
CARL-ZEISS-STIFTUNG TRADING AS CARL ZEISS |
发明人 |
HAMM UWE W;KASPAREK MARKUS;JACOBS OLIVER |
分类号 |
H01L21/302;C03C15/00;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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