发明名称 METHOD FOR STRUCTURING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide an ion etching method which does not include the supply of a fluorinated organic compound gas. SOLUTION: The method for structuring a substrate having a construction of micrometer or nanometer region does not include the supply of a fluorinated organic compound gas. The method is performed by a reactive ion etching by using a mask, plasma and a fluorinated organic compound arranged on a substrate, and the fluorinated organic compound is provided in solid polymer form. A method for etching the coating on the substrate of the surface of the substrate is also provided.
申请公布号 JP2002141330(A) 申请公布日期 2002.05.17
申请号 JP20010281467 申请日期 2001.09.17
申请人 CARL-ZEISS-STIFTUNG TRADING AS CARL ZEISS 发明人 HAMM UWE W;KASPAREK MARKUS;JACOBS OLIVER
分类号 H01L21/302;C03C15/00;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):H01L21/306 主分类号 H01L21/302
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